| About this Abstract |
| Meeting |
2024 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Functional and Structural Thin Films and Coatings
|
| Presentation Title |
Enhanced Structural and Optical Quality of Rutile-phase Controlled GeO2 Epitaxial Films on MgO(100) for Application in Optoelectronics |
| Author(s) |
Paul Nalam, Debabrata Das, Ramana Chintalapalle |
| On-Site Speaker (Planned) |
Paul Nalam |
| Abstract Scope |
Germanium dioxide (GeO2) is an ultrawide band gap semiconductor with exceptional ambi-polar dopability, which makes it ideal for application in next generation optoelectronics and multifunctional device applications. However, the primary bottleneck for GeO2 utilization in advanced applications is the complexity in selectively synthesizing the desired polymorph with controlled phase and properties. In this context and motivated by the scientific challenge of achieving enhanced crystal quality and tunable optical properties, we demonstrate the growth of rutile GeO2 (r-GeO2) films by the well-known and widely adopted magnetron sputtering deposition. The r-GeO2 thin films were deposited onto MgO(100) substrates in a closely controlled oxidation environment. The r-GeO2 films were deposited by varying the oxygen partial pressure onto MgO(100) substrates, where the lower degree of lattice mismatch with the r-GeO2 provides the ability to tune the degree of epitaxy and preferential orientation of the films. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Thin Films and Interfaces, Characterization, Electronic Materials |