About this Abstract |
Meeting |
2025 TMS Annual Meeting & Exhibition
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Symposium
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AI/Data Informatics: Computational Model Development, Verification, Validation, and Uncertainty Quantification
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Presentation Title |
Quantifying Uncertainty of Object Detection Models in Electron Microscopy |
Author(s) |
Ni Li, Ryan Jacobs, Matthew Lynch, Vidit Agrawal, Kevin Field, Dane Morgan |
On-Site Speaker (Planned) |
Ni Li |
Abstract Scope |
Quantifying prediction uncertainty when applying object detection models to new, unlabeled datasets is critical in applied machine learning. This study introduces an approach to estimate the performance of deep learning-based object detection models for quantifying defects in transmission electron microscopy (TEM) images, focusing on detecting irradiation-induced cavities in TEM images of metal alloys. We developed a random forest regression model that predicts the object detection F1 score, a statistical metric used to evaluate the ability to accurately locate and classify objects of interest. The random forest model uses features extracted from the predictions of the object detection model whose uncertainty is being quantified, enabling fast prediction on new, unlabeled images. The mean absolute error (MAE) for F1 of the trained model on test data is about 0.09, and the R2 score is about 0.77. The approach is shows to be robust across three distinct TEM image dataset with varying domains. |
Proceedings Inclusion? |
Planned: |
Keywords |
Machine Learning, Characterization, Other |