| About this Abstract |
| Meeting |
2021 TMS Annual Meeting & Exhibition
|
| Symposium
|
Characterization of Minerals, Metals and Materials 2021
|
| Presentation Title |
On the Origins of the Discrepancies between Optical, SEM, and EBSD-based Grain Size Measurements |
| Author(s) |
Eric J. Payton, Kayla S Evans |
| On-Site Speaker (Planned) |
Eric J. Payton |
| Abstract Scope |
Accurate characterization of grain size is notably important for the development of structure-property relationships, as grain size affects nearly all engineering properties of structural alloys, from strength and fatigue life to corrosion resistance and thermal conductivity. However, a persistent discrepancy is often observed between electron backscatter diffraction (EBSD) based grain size measurements and those made using optical or electron microscopy. We investigate the origins of this discrepancy through simulating ASTM E112 and E2627 grain size measurements on synthetic microstructures. The relative magnitudes of the effects of resolution, measurement technique, and artifacts (such as image drift and low magnification distortions) will be discussed. Finally, recommendations for best practices for minimizing and reconciling differences between measurements made by the different techniques will be presented. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Modeling and Simulation, Phase Transformations |