| About this Abstract |
| Meeting |
TMS Specialty Congress 2025
|
| Symposium
|
8th World Congress on Integrated Computational Materials Engineering (ICME 2025)
|
| Presentation Title |
Uncertainty Quantification, Error Propagation, and Sensitivity Analysis for Synchrotron X-Ray Residual Stress Measurements |
| Author(s) |
Diwakar Naragani, Chris Budrow, Kelly Nygren, Paul Shade |
| On-Site Speaker (Planned) |
Diwakar Naragani |
| Abstract Scope |
High-energy synchrotron X-rays can measure lattice strains in structural materials under an energy-dispersive or an angle-dispersive modality. During the experimental data collection and analysis workflows several choices are made about the instrumentation, scanning procedure, profile fitting, and material constants that can significantly affect the strain calculated from the diffraction signal. We can explore the impact of these choices within a structured Bayesian framework to deliver accurate and reliable measurements. First, Bayesian uncertainty quantification is used to augment the typical process of calibrating the experimental setup. Second, the determined uncertainty is propagated through the reconstruction software to ascertain error bars on the reported strains. Third, uncertainty due to the material, specifically due to the reference lattice and elastic constants, is also propagated to the predicted residual stress. Finally, a global sensitivity analysis is used to understand the relative importance of these choices for the reported uncertainty on residual stress. |
| Proceedings Inclusion? |
Undecided |