| About this Abstract |
| Meeting |
2020 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
| Presentation Title |
Measurement of Power Law Creep Parameters by Nanoindentation |
| Author(s) |
George M. Pharr, Zhiyuan Liang |
| On-Site Speaker (Planned) |
George M. Pharr |
| Abstract Scope |
Great progress has been made in recent years in making mechanical property measurements at small scales by load- and depth-sensing indentation methods, also known as nanoindentation. Such measurements are usually made with sharp pyramidal indenters, which allow for high point-to-point spatial mapping of properties as well as the mechanical characterization of very thin films, thin surface layers, and small particles. Recent advances have expanded the technique to high temperatures, thus paving the way for the small-scale measurement of parameters characteristic of time-dependent creep deformation. However, in doing so, serious experimental difficulties are often encountered, and how one converts the data obtained in nanoindentation tests to the parameters normally used to characterize uniaxial creep is not at all straightforward. In this presentation, we report on recent progress in making meaningful measurements of power law creep parameters based on improved experimental methods and analytical procedures. |
| Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |