| About this Abstract |
| Meeting |
2025 TMS Annual Meeting & Exhibition
|
| Symposium
|
Characterization of Minerals, Metals and Materials 2025: In-Situ Characterization Techniques
|
| Presentation Title |
Low Voltage Electron Back-Scatter Diffraction: Enabling High Resolution Mapping of Early Stage Recrystallization |
| Author(s) |
Zehua Liu, Marc DeGraef |
| On-Site Speaker (Planned) |
Zehua Liu |
| Abstract Scope |
Misorientation measurements at the early stage recrystallization of abnormal grains and subgrains are made using a fast heating stage and in-situ EBSD at low KeV. High purity aluminum (99.999%) was cold rolled to 75% reductions and annealed. Through EMsoft dictionary indexing, subgrain boundaries migration process during incubation time has been characterized and abnormal subgrains are observed in the process. High resolution mapping of the deformed Aluminum provided some insight into the evolution of the local deformation state. Experiments results offered some new insights of the misorientation changes of abnormal subgrain boundaries during the early-stage recrystallization. Subgrain boundaries are found to be surprisingly active for the high purity aluminum during the annealing process below typical recrystallization temperature. Subgrains with different textures exhibit different growth kinetics. We will also present comparison of the EMsoft derived maps with those generated by other high angular resolution EBSD approach, in particular the OpenXY package. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Aluminum, Characterization, |