| About this Abstract |
| Meeting |
2022 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
| Presentation Title |
Applications of Direct Detection for EBSD Analysis of Deformed Materials |
| Author(s) |
Matthew M. Nowell, Stuart Wright, William Lenthe, Rene de Kloe |
| On-Site Speaker (Planned) |
Matthew M. Nowell |
| Abstract Scope |
Electron Backscatter Diffraction has become an essential tool for the characterization of deformed materials. Recent advanced in detector technology have expanded the capabilities of this microanalysis technique. Direct detectors, where the traditional phosphor screen used to convert diffracted electrons into light photons and the optical coupling between the phosphor and the sensor are eliminated, directly capture these electrons with a position-sensitive detector and have recently become available for EBSD applications. These detectors provide high sensitivity and zero distortions. The heightened sensitivity allows operation at lower beam doses which reduce the interaction volume, which can be beneficial when sampling deformed materials. The removal of phosphor and optical distortions and artifacts improves cross-correlation performance for improved angular resolution via HR-EBSD. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Additive Manufacturing, Iron and Steel |