About this Abstract |
Meeting |
MS&T24: Materials Science & Technology
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Symposium
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Emergent Materials under Extremes and Decisive In Situ Characterizations
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Presentation Title |
Quantifying High-Pressure Fe Recrystallization Kinetics Using In Situ Synchrotron X-Ray Multi-Anvil Compression |
Author(s) |
Darren C. Pagan, Lukas Kissel, Matthew Whitaker |
On-Site Speaker (Planned) |
Darren C. Pagan |
Abstract Scope |
High pressures, often exceeding several times the yield strength, are encountered in many industrial metal forming processes. These pressures alter the kinetics of defect and interface motion which is generally not accounted for due to the challenges of quantitative characterization. Here we demonstrate that synchrotron X-ray compatible multi-anvil presses, originally designed for studying mineral deformation in the lower crust, can be adapted to studying high-pressure microstructural evolution in metals. Recrystallization of pure Fe is monitored using in situ high-energy X-ray diffraction at 675 °C with 1 and 2 GPa applied. Principal component analysis applied to the in situ diffraction data is used to quantify the transition from a fine-grained microstructure with high dislocation content to a coarse-grained microstructure with low dislocation content. The recrystallization rates are characterized by fitting Avrami functions to the first principal component of the diffraction data and showed significantly slowed transformation kinetics with increasing pressure. |