About this Abstract |
Meeting |
2020 TMS Annual Meeting & Exhibition
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Symposium
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Characterization: Structural Descriptors, Data-Intensive Techniques, and Uncertainty Quantification
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Presentation Title |
Uncertainty Quantification of Far-field HEDM Measurements |
Author(s) |
Rachel Lim, Joel Bernier, Anthony Rollett, Paul Shade |
On-Site Speaker (Planned) |
Rachel Lim |
Abstract Scope |
Far-field high energy x-ray diffraction microscopy (ff-HEDM) is a synchrotron-based x-ray technique which can be employed to study micromechanics in polycrystalline materials. A diffraction simulator was built to model the experimental setup with the variety of different parameters in order to quantify the uncertainty coming from experimental equipment and setup on the measurements center-of-mass, grain-averaged orientation, and grain-averaged elastic strain tensor. Additionally, the representative volume element (RVE) to get statistically significant data from ff-HEDM is studied for several different properties including elasticity and plasticity. It has been found that the RVE for elasticity increases with increasing macroscopic strain while the RVE for plasticity remains constant as macroscopic strain increases. |
Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |