| About this Abstract |
| Meeting |
2025 TMS Annual Meeting & Exhibition
|
| Symposium
|
Spectroscopic Methods and Analysis for Nuclear Energy Related Materials
|
| Presentation Title |
X-Ray Diffraction-Computed Tomography (XRD-CT) Facility at
NSLS-II for Studying Materials for Nuclear Applications |
| Author(s) |
Mehmet Topsakal, Simerjeet Gill |
| On-Site Speaker (Planned) |
Mehmet Topsakal |
| Abstract Scope |
X-ray scattering techniques coupled with world-class intensity and brightness of the National Synchrotron Light Source II (NSLS-II) at Brookhaven National Laboratory enable an exceptional opportunity for non-destructive studies of high-Z materials such as uranium-alloys. We will give a brief overview of a x-ray diffraction based computed-tomography (CT) endstation at 28-ID-2 beamline of NSLS-II for synchrotron based characterization resources for nuclear science community under the umbrella of Nuclear Science User Facilities (NSUF). It is a unique endstation which can focus the x-ray beam down to ~10 um in high-energy regime (>68 keV) and intended to be a crosscutting tool that will enable multi-modal studies (XRD, PDF, XRF, tomography, imaging) of high-Z materials, a crucial capability for nuclear materials research. In addition, a broad overview of results on various user experiments and projects will be presented to demonstrate the capabilities. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Nuclear Materials, Other, Characterization |