Abstract Scope |
The capabilities provided by next generation light sources along with the development of new characterization techniques and detector advances are revolutionizing materials characterization (metrology) by providing the ability to perform scale-bridging, multi-modal materials characterization under in-situ and operando conditions. For example, providing the ability to image in 3D large fields of view (~mm3) at high resolution (<10 nm), while simultaneously acquiring information about structure, strain, composition etc.
However, these novel capabilities dramatically increase the complexity and volume of data generated. Conventional data processing and analysis methods become infeasible in the face of such large and varied data streams. The use of AI/ML methods is becoming indispensable for real-time analysis, data abstraction and decision making at advanced, high-data rate instruments. I will describe how high-performance computing (HPC) along with AI on edge devices enables real-time data analysis and self-driving experiments, creating the next generation of AI-powered materials characterization tools. |