| About this Abstract |
| Meeting |
2020 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Microelectronic Packaging, Emerging Interconnection Technology and Pb-free Solder
|
| Presentation Title |
Determination of β-tin Slip Properties using Micro-pillar Tests and Crystal Plasticity Modelling |
| Author(s) |
Yilun Xu, Tianhong Gu, Ben Britton, Fionn Dunne |
| On-Site Speaker (Planned) |
Yilun Xu |
| Abstract Scope |
The mechanical properties of a high-purity β-tin crystal have been investigated at room temperature and with various loading rates utilizing a coupled micro-pillar test and crystal plasticity finite element (CPFE) modelling. Square cross section samples were prepared by focused ion beam (FIB), and each sample contained a single β-tin crystal with grain orientations [100]-like and [001]-like with respect to the nano-compression direction. The favourable slip systems in the two grains have been identified by analysing the slip traces. Reasonable agreement of force-displacement curves obtained in the experiments and the crystal plasticity modelling with different displacement rates has been achieved, which validates the mechanical properties, including the slip strength, hardening term and rate-sensitivity governing parameters, extracted for β-tin single crystals. The properties will be implemented in multi-phase, polycrystal crystal plasticity models with explicitly modelled intermetallic crystals (IMCs) to predict faithful quantitative behaviour of solder joint performance under thermo-mechanical and impact loading. |
| Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |