| About this Abstract |
| Meeting |
2022 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
| Presentation Title |
Imaging Defects and Their Dynamics Using Scanning Electron Microscopy Approaches |
| Author(s) |
Daniel Gianola |
| On-Site Speaker (Planned) |
Daniel Gianola |
| Abstract Scope |
The past several years has witnessed a surging popularity of two techniques for defect characterization in crystalline materials: (i) scanning transmission electron microscopy (STEM) using diffraction contrast imaging, and (ii) electron back-scattered diffraction (EBSD) mapping. Here, we link these capabilities by employing a field emission SEM equipped with a transmission detector for defect characterization – termed transmission SEM (TSEM). Imaging modes that are similar to conventional CTEM bright field (BF) and dark field (DF) and STEM are explored, and some of the differences due to the varying accelerating voltages highlighted. We further demonstrate how the richness of information encoded in EBSD patterns is amplified by a new generation of direct electron detectors that enable high speed mapping and acquisition of high-fidelity patterns that can be used for statistically-meaningful defect analyses. We employ these techniques for in situ tensile experiments to study the nature of dislocations dynamics in several structural alloys. |
| Proceedings Inclusion? |
Planned: |