| About this Abstract |
| Meeting |
2020 TMS Annual Meeting & Exhibition
|
| Symposium
|
Additive Manufacturing for Energy Applications II
|
| Presentation Title |
In-situ Monitoring to Inform Process Optimization and Microstructure Control |
| Author(s) |
Glenn E. Bean, David Witkin, Tait McLouth, Alison Kremer |
| On-Site Speaker (Planned) |
Glenn E. Bean |
| Abstract Scope |
For material produced via additive manufacturing, there are limited post-processing and non-destructive evaluation methods to ensure defect-free geometries, which drives the need for inspecting the material during its production. Commercial solutions for in-process monitoring are typically used to discern deviations from typical processing windows, but the thermal and optical signatures captured by these tools can also be leveraged to understand the development of microstructure and porosity. Connecting in-situ monitoring signatures with porosity, microstructure, and mechanical properties is the first step towards the ultimate goal of real-time feedback for process and microstructure optimization. This work focuses on the use of Inconel 718 printed via selective laser melting to correlate sensor data and OEM-processed signal metrics with physical material quality, microstructure morphology, crystalline texture, and mechanical behavior with respect to variation in laser processing parameters. |
| Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |