ProgramMaster Logo
Conference Tools for 2025 TMS Annual Meeting & Exhibition
Login
Register as a New User
Help
Submit An Abstract
Propose A Symposium
Presenter/Author Tools
Organizer/Editor Tools
About this Abstract
Meeting 2025 TMS Annual Meeting & Exhibition
Symposium Novel Strategies for Rapid Acquisition and Processing of Large Datasets from Advanced Characterization Techniques
Presentation Title Application of the polyhedral template matching method for characterization of 2D atomic resolution electron microscopy images
Author(s) Darcey Britton, Douglas L. Medlin, Alejandro Hinojos, Michelle Hummel, David P. Adams
On-Site Speaker (Planned) Darcey Britton
Abstract Scope We present an adaptation of the polyhedral template matching method to a form for analysis of two-dimensional STEM and TEM images. The two-dimensional polyhedral template matching (2D-PTM) method uses Matlab code to identify certain structures, such as FCC <110>, BCC <111>, and HCP <2110>, in images by scaling and rotating two-dimensional templates of these structures. This process also involves identifying the neighboring atomic peaks for each atomic peak in an image, which can then be compared analytically to the provided templates. We demonstrate the method for examples in nanocrystalline gold and martensitic phases in austenitic stainless steel and also cover extensive calculations on uncertainty and the distinguishability between different structure types. Sandia National Laboratories is a multimission laboratory managed and operated by National Technology and Engineering Solutions of Sandia, LLC., a wholly owned subsidiary of Honeywell International, Inc., for the US DOE’s NNSA under contract DE-NA-0003525.
Proceedings Inclusion? Planned:
Keywords Characterization, Computational Materials Science & Engineering,

OTHER PAPERS PLANNED FOR THIS SYMPOSIUM

A Retrieval-Augmented Generation Application in the Dental Composites Space
Accelerated Discovery of nanostructured High-Entropy Alloys With Superior Thermal Stability
Advanced Computational and Data Management Approaches at the Advanced Photon Source
AI-Driven Kikuchi Pattern Enhancement for Efficient and Robust EBSD Analysis of Highly Deformed Metals
AI-Driven Microstructural Data Correlation Using In-Situ Raman Spectroscopy in Self-Driving Lab by Using Chocolate As Frugal Twin
Application of the polyhedral template matching method for characterization of 2D atomic resolution electron microscopy images
Automated Real-Time 3D Stereo-Reconstructions Through Machine-Learning based Tracking
Challenges and Opportunities for Rapid EXAFS Analysis of Short-Range Order in HEAs
Characterization within an Automated Lab for Solid State Synthesis - Challenges and Solutions for Data Handling and Interpretation
Comparing Performance of U-Net Based Neural Networks for Automated Detection of Defects in TEM Images of Nuclear Materials
Correlative Microscopy and AI for Rapid Analysis of Complex Material Structures
Data Infrastructure - ‘The Missing Middle’
Deep Learning-Assisted Study of 3D Damage Evolution in Semiconductor Packages under Thermal Cycling Using X-ray Microcomputed Tomography
Deep Learning Conditional Diffusion models to recreate Scanning Electron Microscopy using Light Optical Microscopy Priors
Directing Flow: Pipelines for 3D Data
Efficient SEM Imaging Strategies for Microstructure Analysis in Metal Additive Manufacturing
Enhanced quantification of reinforcement particles in additively manufactured IN718 using microfocus X-ray computed tomography and CGAL Alpha Wrapping tool
From chaos to clarity: Managing the materials data surge
High-Throughput Quantitative Texture Imaging Using Wide-Field Laser Polarized-Light Microscope
High-throughput synthesis and rapid characterization of Cu-Ti alloys
High-Throughput Uniaxial Tensile/Compressive Testing in Additive Manufacturing Using Reference Material Load Cell Method
High throughput characterization of 316L stainless steel fabricated using laser powder bed fusion
Interrogating 3D Grain Morphology and Crystallographic Texture via Automated Polarized Light Microscopy
Optimization of Automated Sample Polishing Enabled by the Characterization of Surface Roughness Evolution
Optimizing Nanoindentation Methods for the High Throughput Study of Combinatorial Thin Film Libraries
Overview of Machine Learning in Low-Latency Automated Data Analysis for In-Situ Synchrotron X-ray Diffraction in Metals and Alloys
Rapid data-driven non-destructive inspection of additively manufactured IN718 using the side-band peak counting (SPC) non-linear ultrasonics method
Rapid synthesis, characterization and mechanical testing of novel printable alloys via functional grading in additive manufacturing
Real time Pole figures from polycrystalline samples during far field HEDM
Strategies for accelerated collection, and data curation of multi-modal serial-sectioning experiments.
Three-dimensional Laue-diffraction microscopy with a coded aperture: principles and high-performance-computing workflow
Towards Accelerated Material Characterization: Uncertainty Quantification in Elemental Analysis
“Microstructure Informatics”: Automated microstructure characterization and neural network based modeling of processing-structure-property relations.

Questions about ProgramMaster? Contact programming@programmaster.org