About this Abstract |
Meeting |
TMS Specialty Congress 2024
|
Symposium
|
2nd World Congress on Artificial Intelligence in Materials & Manufacturing (AIM 2024)
|
Presentation Title |
Image Analysis of Fractography: Defect Feature Comparisons |
Author(s) |
Kristen Jo Hernandez, Austin Ngo, Ayorinde Emmanuel Olatunde, Thomas Ciardi, Pawan K. Tripathi, Anirban Mondal, John Lewandowski, Laura Bruckman, Roger French, Anthony Lino |
On-Site Speaker (Planned) |
Anthony Lino |
Abstract Scope |
Fractography provides insight to defects below the resolution of traditional non-destructive testing (NDT) such as X-Ray Computed Tomography (XCT) or defects partially revealed during the preparation of metallography samples. In Additively Manufactured (AM) parts, defects in a printed material serve as the initiation site of failure. Defects such as lack-of-fusion (LoF), keyhole, or other morphological defects have measurable qualities that are unique. Samples fabricated under a range of speed-power combinations covering each defect regime were evaluated with Scanning Electron Microscopy (SEM) on the fracture surface. Traditional evaluation involves manual annotation of thousands of defect features on hundreds of images. Machine learning can accelerate this process by automatically segmenting features of interest given a subset of training samples. In this study we employ multiple feature extraction techniques: manual annotation, WEKA semi-supervised machine learning, and fully-supervised deep learning using U-Net to observe the distribution of detected features and compare time-accuracy tradeoffs. |
Proceedings Inclusion? |
Definite: Other |