| About this Abstract |
| Meeting |
2023 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
| Presentation Title |
Coded Apertures for Fast Depth Resolved Diffraction and In-situ Characterization |
| Author(s) |
Dina Sheyfer, Doga Gursoy, Jon Tischler, Wenjun Liu, Michael Wojcek |
| On-Site Speaker (Planned) |
Dina Sheyfer |
| Abstract Scope |
We develop a rapid data acquisition and reconstruction method to image the internal structure of crystalline materials using non-destructive X-ray Laue diffraction microscopy. Our method relies on scanning a coded-aperture across the diffracted beams, and a decoding algorithm to extract Laue patterns as a function of depth along the incident illumination path. This method provides rapid access to full diffraction information at sub-micrometer volume elements in bulk materials and thus can resolve locally in 3D crystal structure, its orientation and strain and can be utilized together with in-situ measurements. Here we present the underlying theory and demonstrate the utility of this approach with micrometre-resolution depth resolving measurements of grain orientations and sizes in polycrystalline Nickel foil. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Copper / Nickel / Cobalt, |