| About this Abstract |
| Meeting |
2023 Annual International Solid Freeform Fabrication Symposium (SFF Symp 2023)
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| Symposium
|
2023 Annual International Solid Freeform Fabrication Symposium (SFF Symp 2023)
|
| Presentation Title |
The Effect of Thermal Conditions on Process Defects in Electron Beam Directed Energy Deposition |
| Author(s) |
Ronald Aman, Alex Kitt, Dan Ruscitto, Luke Mohr, Zach Corey, Naresh Iyer |
| On-Site Speaker (Planned) |
Ronald Aman |
| Abstract Scope |
Observing process defects at size scales and with sufficient confidence relevant to qualification efforts has not yet been achieved in metal AM, so non-destructive testing (NDT) techniques are used to detect porosity within material deposited. NDT costs can be significant and may not achieve targeted resolution due to geometry and material limitations. In this work, in-process monitoring of Electron Beam Directed Energy Deposition (EB-DED) is enhanced to include three thermal history conditions; inter-pass, melt pool superheat and trailing bead temperatures. Quality scenarios are applied to simulate various process conditions during EB-DED at three different thermal conditions within production relevant use cases and resultant process defects are characterized via high throughput computed tomography. Defects are spatially and temporally registered to process conditions observed during EB-DED and statistically mapped to thermal and quality scenarios. This work is supported by the US Department of Energy office of Energy Efficiency under award DE-EE0009399. |
| Proceedings Inclusion? |
Definite: Post-meeting proceedings |