About this Abstract |
Meeting |
2025 TMS Annual Meeting & Exhibition
|
Symposium
|
Characterization of Materials through High Resolution Coherent Imaging
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Presentation Title |
Coherent x-Ray Diffraction Imaging Dedicated Beamlines at PLS-II and Korea-4GSR |
Author(s) |
Daseul Ham, Su Yong Lee |
On-Site Speaker (Planned) |
Su Yong Lee |
Abstract Scope |
The fourth-generation storage ring (4GSR) features an extremely small emittance in the horizontal direction. Therefore, it is expected that the 4GSR will provide X-rays with improved transverse coherence and brightness compared to third-generation storage rings such as Pohang Light Source-II (PLS-II). The Coherent X-ray Scattering (CXS) beamline at PLS-II is dedicated to CDI techniques such as Bragg CDI, Plane-wave CDI, and Ptychography. Hard X-rays generated by an undulator are focused using Kirkpatrick-Baez (KB) mirrors in the beamline. The intense and coherent microbeam makes it possible to perform not only CDI but also microbeam diffraction experiments. The layout, specifications, and scientific applications of the beamline will be briefly introduced. Additionally, the Coherent X-ray Diffraction (CoXRD) beamline at Korea-4GSR, currently under design, will be compared with the CXS beamline in terms of layout and performance. |
Proceedings Inclusion? |
Planned: |
Keywords |
Characterization, Nanotechnology, Other |