About this Abstract |
Meeting |
2021 TMS Annual Meeting & Exhibition
|
Symposium
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Characterization of Materials through High Resolution Imaging
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Presentation Title |
The Fourth is Strong in These Ones! |
Author(s) |
Ian McNulty |
On-Site Speaker (Planned) |
Ian McNulty |
Abstract Scope |
Three new x-ray sources form the vanguard of a fourth generation of synchrotron machines offering 100-fold greater brightness than the previous generation. At least two more fourth-generation sources are under construction with several others envisioned worldwide. The short wavelengths of x-rays offer large penetration depth, sensitivity to atomic, electronic, and magnetic structure, and imaging at a resolution approaching atomic dimensions. These sources open entirely new vistas for high resolution coherent x-ray imaging of materials due to its hunger for source brightness.
The first, MAX IV in Sweden, began operating in mid-2016. Five of the sixteen beamlines at MAX IV have dedicated experimental stations for soft and hard x-ray imaging. Early imaging results have already been obtained with the latest sources, ESRF-EBS in France and SIRIUS in Brazil. This talk reviews recent progress and considers new opportunities for material imaging with these super-bright x-ray sources. |
Proceedings Inclusion? |
Planned: |
Keywords |
Electronic Materials, Energy Conversion and Storage, Magnetic Materials |