Abstract Scope |
Characterizing defects in oxide materials is challenging due to the limitations of existing techniques. Methods like temperature equilibrium conductivity and impedance spectroscopy lack spatial resolution, while transmission electron microscopy (TEM) provides atomic-level mapping but is restricted to surfaces or thin sections, potentially misrepresenting bulk properties. Dark Field X-ray Microscopy (DFXM) is proposed to spatially resolve point defect distributions in bulk materials.
This study focuses on dislocation-free yttrium aluminum garnet (YAG)doped with chromium, thulium, and holmium, visualizing buried chemical defects that manifest as growth striations. The striations were characterized in therms of chemical composition and orientation, with 3D models constructed to analze their behavior under an electric field. YAG, widely used in medical laser and X-ray detector scintillators, was selected as a promising candidate for studying chemical defects using DFXM. This approach holds significant potential for advancing materials with technological applications. |