| About this Abstract |
| Meeting |
2025 TMS Annual Meeting & Exhibition
|
| Symposium
|
Characterization of Minerals, Metals and Materials 2025: In-Situ Characterization Techniques
|
| Presentation Title |
A New Technology Innovation for Material Thermal Conductivity Measurements: Thermo-Optical Plane Source (TOPS) |
| Author(s) |
Ron Fisher, Jeffrey Braun |
| On-Site Speaker (Planned) |
Jeffrey Braun |
| Abstract Scope |
We demonstrate a new innovative technology, a high-throughput, simple, and efficient method to measure thermal conductivity of materials with minimal sample preparation and limited restrictions on sample shape and geometry. The Thermo-Optical Plane Source (TOPS) technique uses laser heating to induce a steady-state temperature rise in a material and infrared thermography to measure the corresponding temperature rise. A simple analysis using Fourier’s law allows for the determination of a material’s thermal conductivity. In contrast to convectional thermal conductivity measurement techniques, TOPS is a direct measure of thermal conductivity rather than thermal diffusivity or effusivity, negating any need to know a sample’s density or heat capacity. We demonstrate the ability to measure thermal conductivities ranging from ~0.05 W/m-K to ~60 W/m-K at room temperature. Applications include additively manufactured materials, ceramics, TIM’s, thin films, TBC’s, composites, polymers. TOPS is capable of measuring solids, liquids and pastes all in one instrument. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Computational Materials Science & Engineering, Other |