| Abstract Scope |
Cross-correlation-based electron backscatter diffraction (EBSD), also known as high angular resolution EBSD, provides approximately 2 orders of magnitude improvement in angular precision over Hough-based indexing, while also providing access to the three-dimensional elastic strain gradient tensor. Recent improvements in electron detection, specifically the advent of commercial direct detection options, raise the possibility of higher fidelity and more rapid measurements. In this talk, I will show results comparing the expected precision of different generations of electron detectors, including direct detection, based off of beam shift experiments taken from single crystal Si samples. I will also present a case study exploring the defect state in additive manufactured stainless steel characterized using direct detection EBSD patterns. Using OpenXY analysis, we are able to directly characterize the dislocation cell structures at high spatial and angular resolution, providing insight into potential defect formation mechanisms. |