| About this Abstract |
| Meeting |
2025 TMS Annual Meeting & Exhibition
|
| Symposium
|
Elucidating Microstructural Evolution Under Extreme Environments
|
| Presentation Title |
Mesoscale Simulation of Performance Degradation of Electronic Devices Caused by Ionizing Radiation |
| Author(s) |
Xiaoyu Guan, Michael Tonks |
| On-Site Speaker (Planned) |
Xiaoyu Guan |
| Abstract Scope |
Ionizing radiation impacts the performance of electronic devices due to charge carrier insertion and radiation damage. Diodes and MOSFETs react to ionizing radiation with current drop and increasing recombination amount under forward bias. In opto-electronic devices, this impacts the electron-hole recombination that is responsible for light generation. We are developing a multiphysics tool for simulating the impact of ionizing radiation on electronic and opto-electronic devices. A combination of binary collision Monte Carlo and mesoscale simulation using the MOOSE framework combined to predict short term device response and long term device degradation. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Computational Materials Science & Engineering, Electronic Materials, ICME |