| About this Abstract |
| Meeting |
2022 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
| Presentation Title |
Full Field Crystal Plasticity Simulations of Measured Microstructures: Going 3D |
| Author(s) |
Martin Diehl, Nikhil Prabhu |
| On-Site Speaker (Planned) |
Martin Diehl |
| Abstract Scope |
Full field crystal plasticity simulations of measured microstructures have been routinely employed in the last years. However, typically these microstructures have been obtained using Electron Backscatter Diffraction (EBSD), i.e. the simulations are limited to two dimensions. Unfortunately, the stress and strain partitioning predicted by two dimensional simulations differs significantly from the realistic three dimensional case. A common approach to overcome the limitations of two dimensional simulation is the creation of artificial microstructure based on the statistical properties obtained from surface measurements. While this approach is very suitable for studying statistical properties, it does not allow to perform one to one comparison to experimental measurements which are especially helpful for investigating the predictive capabilities of the chosen constitutive model. Here, we present full field simulation of microstructures obtained from 3D synchrotron characterization. The comparison between experimental and simulated results is used to discuss the limitations of the employed crystal plasticity model |
| Proceedings Inclusion? |
Planned: |
| Keywords |
ICME, Mechanical Properties, Modeling and Simulation |