| About this Abstract |
| Meeting |
2020 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
| Presentation Title |
In situ Synchrotron and EBSD Study of H-induced Local Stresses |
| Author(s) |
Jinwoo Kim, Haoxue Yan, S. Mohadeseh Taheri-Mousavi, C. Cem Tasan |
| On-Site Speaker (Planned) |
Jinwoo Kim |
| Abstract Scope |
Hydrogen embrittlement of structural metallic materials is a long-pending problem for various industries, and the interaction between hydrogen and crystallographic defects plays the key role in this phenomenon. Our recent investigations have revealed that hydrogen segregation at grain boundaries lead to increased local stresses, which can induce micron-scale dislocation activity in the vicinity of grain boundaries that are at the surface of sheet metal. In this present work, we investigate the effect of the H-induced stress fields in the bulk. To this end, we designed a novel in situ H charging setup for synchrotron X-ray diffraction, which enables a real-time diffraction analysis in transmission mode during H-ingress. The diffraction results in combination with cross-correlation EBSD analyses and simulations suggest how the H-induced stress fields can cause local crystallographic changes in adjacent grains in steels, even in absence of any externally applied stress. |
| Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |