About this Abstract |
Meeting |
2020 TMS Annual Meeting & Exhibition
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Symposium
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ICME Gap Analysis in Materials Informatics: Databases, Machine Learning, and Data-Driven Design
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Presentation Title |
Automated Data Curation for Electron Microscopy Using the Materials Data Facility |
Author(s) |
Charudatta Phatak, Jonathon Gaff, Ian Foster, Ben Blaiszik |
On-Site Speaker (Planned) |
Charudatta Phatak |
Abstract Scope |
Modern electron microscopy is no longer only driven by instrumentation, but is increasingly linked with computational and data-driven algorithms and methods for acquisition and analysis. Harnessing this data for scientific research especially to enable machine learning approaches necessitates development of a supportive data infrastructure of large and well-curated datasets that can be used reliably. We will demonstrate an automated data curation workflow for electron microscopy that imposes minimal burden on users for additional information, yet collects data in a form amenable to automated analysis and machine learning. This workflow is developed using the Materials Data Facility (MDF). We will discuss the implementation of the workflow for a multi-user transmission electron microscope facility. Our approach allows the end-user to create a record entry for their datasets, search through their data easily, and streamlines the final publication ready data to be shared. Future work will involve consolidation of records from multiple instruments. |
Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |