| About this Abstract |
| Meeting |
2022 TMS Annual Meeting & Exhibition
|
| Symposium
|
Late News Poster Session
|
| Presentation Title |
L-55: Digital Image Processing for the Analysis of Spray Coated Porous Films |
| Author(s) |
Noah M. McAllister, Robert A. Green-Warren, Jae-Hwang Lee, Assimina A. Pelegri, Jonathan P. Singer |
| On-Site Speaker (Planned) |
Noah M. McAllister |
| Abstract Scope |
Self-limiting electrospray deposition (SLED) has been shown to be a means of creating thin, porous polymeric films conformally on complex surfaces. Thickness measurements are needed to quantify the porosity of these films. However, current optical film measurement techniques are only applicable for dense films; or, the technique is destructive in nature. Here, we present a means of non-destructively measuring the thickness of porous polymeric thin films deposited through SLED. This technique compensates for the scattering associated with porous films by using image processing on reflection and transmission optical micrographs. A Savitzky-Golay-based differentiator is used to find the inflection points of the image which represent the interface and boundary of the film, as shown in reflection and transmission, respectively. A comparative study between cross-sectional SEM (where scattering effects are diminished) and optical microscopy verifies that our optical microscopy technique can be used to consistently, non-destructively measure film thickness. |
| Proceedings Inclusion? |
Undecided |
| Keywords |
Polymers, Characterization, Other |