| About this Abstract |
| Meeting |
2025 TMS Annual Meeting & Exhibition
|
| Symposium
|
Neutron and X-ray Scattering in Materials Science and Engineering
|
| Presentation Title |
Back-Grinding for Improved X-Ray Diffraction |
| Author(s) |
Braden Miller, Joshua Cline, Michael T. Hurst, James Paramore, Anup Bandyopadhyay, Eli Norris, Brady Butler |
| On-Site Speaker (Planned) |
Braden Miller |
| Abstract Scope |
From its initial development, X-ray diffraction (XRD) has been essential for examining the crystal structure and phase composition of materials since its inception. Initially, Laue's X-ray crystallography used monocrystals, but powder diffraction methods later simplified phase analysis and indexing. XRD can also characterize bulk polycrystalline samples, though texture and grain size may complicate acquiring high-quality patterns. This study analyzed bulk polycrystalline metals with XRD to validate CALPHAD predictions for multi-principal-element alloys (MPEAs). High throughput diffraction methods were employed but faced challenges due to large grain sizes, which reduced the number of grain orientations indexed compared to ideal powder diffraction. Despite using large area detectors, few orientations satisfied the Bragg condition, resulting in poor XRD results. To address this, a back-grinding method was used to increase plane orientations. Samples were back-ground with two silicon carbide paper sizes, with the largest grit being most effective. Back-grinding smeared sample surfaces, significantly improving indexability. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, High-Entropy Alloys, |