About this Abstract |
Meeting |
2024 ASC Technical Conference, US-Japan Joint Symposium, D30 Meeting
|
Symposium
|
2024 ASC Technical Conference, US-Japan Joint Symposium, D30 Meeting
|
Presentation Title |
Detection of Microscopic Defects in CFRP Using X-Ray Talbot-Lau Interferometry |
Author(s) |
Akinori Yoshimura, Keisuke Asano, Keita Goto, Masahiro Arai, Tadashi Arimoto |
On-Site Speaker (Planned) |
Akinori Yoshimura |
Abstract Scope |
In this study, the authors propose a new method which can detect microscopic defects in CFRP including voids, fiber misalignments, and resin pockets, by using X-ray Talbot-Lau interferometry. Such microscopic defects may have significant effects on the mechanical properties of CFRP. X-ray Talbot-Lau interferometer (X-ray TLI) consists of X-ray source, three diffraction gratings, and X-ray detector. It has capability to take three types of images in one time: attenuation image, differential phase image, and dark-field image. Those images correspond to the X-ray attenuation in the sample, variation of X-ray refractive index in the sample, and X-ray scattering in the sample. X-ray TLI provides a promising approach for detection of microscopic defects because images taken by X-ray TLI has various information in the sample and it can capture a wide area in short time. In this study, we investigate relationships between microscopic defects and its effect on the images captured by X-ray TLI, by using CFRP specimens in which various type of microscopic defects are artificially introduced. The effect of each type of defect on images in X-ray TLI is then modeled according to the results. In the present study, we will present that microscopic defects including voids, fiber misalignment, and resin pockets can be detected by using the model. |
Proceedings Inclusion? |
Definite: Post-meeting proceedings |