| About this Abstract |
| Meeting |
2025 TMS Annual Meeting & Exhibition
|
| Symposium
|
Characterization of Minerals, Metals and Materials 2025: In-Situ Characterization Techniques
|
| Presentation Title |
High Energy Diffraction Microscopy as a Tool for In-Situ Characterization of Materials |
| Author(s) |
Hemant Sharma, Weijian Zheng, Jun-Sang Park, Peter Kenesei, Rajkumar Kettimuthu, Antonino Miceli |
| On-Site Speaker (Planned) |
Hemant Sharma |
| Abstract Scope |
High Energy Diffraction Microscopy, or HEDM, is a non-destructive tool for in-situ mapping of material microstructures using High-Energy X-rays. This talk will show examples of different HEDM modes (far-field for strain characterization, near-field for grain boundary mapping, and point-focus for intra-granular strain characterization) that have been utilized to study deformation, thermal, and irradiation processes in materials. Furthermore, we will cover opportunities in HEDM capabilities with the APS-Upgrade, allowing for studies of more complex material structures at higher resolutions. Furthermore, we will describe how machine learning-enabled experimentation can extract rare insight from the materials during in-situ processing. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Computational Materials Science & Engineering, Machine Learning |