| About this Abstract |
| Meeting |
2020 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
| Presentation Title |
Low Strain Grain Boundary Deformation and Damage |
| Author(s) |
Veronica Anghel, Ramon M. Martinez, Cheng Liu, George T. Gray III |
| On-Site Speaker (Planned) |
Veronica Anghel |
| Abstract Scope |
The materials-by-design idea is built upon the premise that critical aspects of materials function can be captured in computational environments that includes making, measuring, and modeling materials. Past research efforts have focused on developing constitutive laws and numerical solvers but less attention has been paid to the representation of material microstructure. The mechanisms of deformation and damage nucleation are strongly dependent on material processing and resulting microstructure. This work focuses on the evolution of deformation and damage nucleation in polycrystalline tantalum under tensile loading at low strain, capturing incipient deformation. In-situ digital image correlation and post-mortem electron backscatter diffraction are applied to quantify the evolution of grain boundary deformation in connection to processing. The material response to deformation is discussed in the context of morphological and textural differences between wrought and additively manufactured tantalum, and is tied to microstructural statistics relevant to the development of predictive capabilities. |
| Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |