| About this Abstract |
| Meeting |
MS&T23: Materials Science & Technology
|
| Symposium
|
Controlled Synthesis, Processing, and Applications of Structural and Functional Nanomaterials
|
| Presentation Title |
Unveiling Nanoscale Strain in Two-dimensional Semiconductors via Near-field Optical Microscopy |
| Author(s) |
Jin Myung Kim, Peiwen Jos Ma, Soyeong Kwon, SungWoo Nam |
| On-Site Speaker (Planned) |
SungWoo Nam |
| Abstract Scope |
Two-dimensional (2D) transition metal dichalcogenides (TMDs) have received considerable attention as an appealing platform of next-generation electronic and optoelectronic devices. Particularly, controlled deformation of their crystal lattice is essential to enable quantum optics applications, such as single photon emission, while precise and non-destructive characterizations of nanoscale strain remain as a significant challenge. Here, we investigate optical characterization of strained 2D semiconductors via near-field photo-induced force microscopy (PiFM). PiFM allows us to analyze nanoscale absorption properties by measuring light-induced dipole interaction force between a metallic tip and a sample. Our PiFM mapping and spectroscopy revealed the strong resonance of A and B excitons in 2D TMDs. In addition, PiFM hyperspectral line scanning on buckle delaminated TMDs showed strain-induced energy shift across sub-micron buckle structure whereas conventional photoluminescence scanning was unable to resolve energy shift. These results pave the way for nanoscale strain analysis of 2D semiconductors beyond optical diffraction limit. |