About this Abstract |
Meeting |
2024 Annual International Solid Freeform Fabrication Symposium (SFF Symp 2024)
|
Symposium
|
2024 Annual International Solid Freeform Fabrication Symposium (SFF Symp 2024)
|
Presentation Title |
Synchrotron-based In Situ/Operando Characterization Capabilities at NSLS-II |
Author(s) |
Zhongshu Ren, Xianghui Xiao, Mingyuan Ge, Yong S Chu |
On-Site Speaker (Planned) |
Zhongshu Ren |
Abstract Scope |
High-resolution non-intrusive characterization techniques are highly desired for understanding additive manufacturing processes, which is critical for optimization and improving part qualities. In this presentation, we will introduce a few advanced characterization capabilities at the National Light Source II (NSLS-II) and focus on one Full-field X-ray Imaging (FXI) beamline. This beamline operates a transmission X-ray microscope (TXM) that provides state-of-art X-ray nano-scale imaging capability at resolutions in the tens of nanometers range. With capabilities for the fastest tomography and x-ray absorption edge spectroscopy (XANES) in the world, nano-scale morphology and chemical composition can be quickly obtained. Through NSLS-II’s recapitalization and upgrade program, new capabilities such as laminography and fluorescence will be integrated into FXI. These advanced capabilities open new pathways and show great potential for enhancing the characterization of additive manufacturing processes, particularly under an in situ/operando conditions. |
Proceedings Inclusion? |
Definite: Post-meeting proceedings |