About this Abstract |
Meeting |
2025 TMS Annual Meeting & Exhibition
|
Symposium
|
Thin Films and Coatings: Properties, Processing and Applications
|
Presentation Title |
Multilayer optical filters for spectral analysis of trace elements in aluminum |
Author(s) |
Tryggvi Kristmar Tryggvason, Kristbjörg Anna Thorarinsdottir, Árni Sigurður Ingason, Fridrik Magnus, Kristjan Leosson |
On-Site Speaker (Planned) |
Árni Sigurður Ingason |
Abstract Scope |
Spectrochemical analysis is generally carried out using spectrally dispersive instruments that can be bulky, expensive, and sensitive to external conditions. In atomic emission spectroscopy, spectrally narrow bandpass filters coupled with individual photodetectors can provide a compact and robust method for monitoring emission signals from individual elements. For plasma emission, the relevant optical signals are often situated in the UV part of the optical spectrum. Hence, special considerations must be made when simulating and fabricating suitable bandpass filters. Here, we report on simulation, fabrication and characterization of multilayer thin-film bandpass filters from UV-transmitting materials and their use in laser-induced breakdown spectroscopy for measuring additive or impurity elements in aluminum and its alloys. Advantages and disadvantages of depositing such filters directly on the facet of multimode optical fibers will be discussed. |
Proceedings Inclusion? |
Planned: |
Keywords |
Thin Films and Interfaces, Modeling and Simulation, Aluminum |