| About this Abstract |
| Meeting |
2025 TMS Annual Meeting & Exhibition
|
| Symposium
|
Nanostructured Materials in Extreme Environments III
|
| Presentation Title |
Grain Boundary Creep in Simple and High Entropy Oxides |
| Author(s) |
Shen J. Dillon |
| On-Site Speaker (Planned) |
Shen J. Dillon |
| Abstract Scope |
Characterizing physical response of grain boundaries in high entropy materials is of great interest for understanding how to engineer their bulk properties. Grain boundary strain exhibits both diffusion limited and defect nucleation rate limited kinetics that govern the Newtonian and non-Newtonian interfacial creep response. This work seeks to understand both contributions to interfacial creep in simple and complex oxides based on the same underlying structure, e.g. ZrO2 and UO2 versus related multicomponent oxides. Direct characterization of both mechanisms requires characterization of creep at individual bicrystal interfaces which is performed using high temperature in situ transmission electron microscopy based nanomechanical testing. |
| Proceedings Inclusion? |
Planned: |