About this Abstract |
Meeting |
MS&T24: Materials Science & Technology
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Symposium
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Additive Manufacturing: Equipment, Instrumentation and In-Situ Process Monitoring
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Presentation Title |
Phase and Stress Manipulation via Operando Multispectral Infrared, Digital Image Correlation, and Neutron Diffraction |
Author(s) |
James C. Haley, Chris Fancher, Calen Kimmel, John Potter, Wei Tang, Ke An, Dunji Yu, Alex Plotkowski |
On-Site Speaker (Planned) |
James C. Haley |
Abstract Scope |
Solid state transformation, such as martensite formation, drives microstructural evolution with the thermal and strain history induced by the complex toolpath in AM. Therefore, accurate in-situ measurement of both temperature and strain are essential to control phase transitions. We employ multispectral infrared imaging to monitor temperature and emissivity, and digital image correlation to measure strain patterns in AM components. Spatially mapping these measurements together permits deconvolution of the thermal strain from elastic-plastic components, enabling the identification of strain-inducing phase changes.
Using these methods, in tandem with operando neutron diffraction for validation, we interrogate common heuristic controls such as infrared threshold temperatures and active substrate thermal control for their efficacy in controlling martensite formation and annealing. We demonstrate the capability of manipulating the pattern of residual stress using these operando sensors as well as the resultant microstructure. In this talk, we discuss methods and implementation, scalability, and implications for controls applications. |