| About this Abstract |
| Meeting |
13th International Conference on the Technology of Plasticity (ICTP 2021)
|
| Symposium
|
13th International Conference on the Technology of Plasticity (ICTP 2021)
|
| Presentation Title |
Deforming Nanometric Volumes at Large Shear Strains by AFM Scratching |
| Author(s) |
Mert Efe, Bharat Gwalani, Jinhui Tao, Tiffany C Kaspar, Arun Devaraj, Aashish Rohatgi |
| On-Site Speaker (Planned) |
Mert Efe |
| Abstract Scope |
Shear deformation can cause significant changes in the microstructures and textures of the deforming materials such as during solid phase processing (e.g. extrusion, friction stir processing, etc.) and material removal (e.g. cutting, grinding, etc.) methods used for manufacturing of components. While the shear deformation and associated mechanisms of microstructural evolution at the bulk scale are well known, effects of shear deformation at nanoscale remain unexplored. In this study, we demonstrate nanoscratching with an atomic force microscope (AFM) tip as a tool to impose large shear strains in nanoscale material volumes. With the AFM process parameters and tip geometry used in our study, nanoscratching of a single-crystal copper substrate resulted in heavily deformed chips and the sub-surface. The nanoscratching process showed characteristics analogous to bulk-scale machining. Deformation analysis, using approaches developed for bulk machining, indicated that the shear strain in the chips and subsurface was ~ 3.9 and 4.6, respectively. TEM examination of the chips and subsurface showed dislocation substructures, geometrically necessary boundaries and other defects akin to those seen in highly deformed bulk materials. However, the level of microstructure refinement was somewhat lower when compared to the single- or polycrystal copper deformed to similar strains at the bulk scale, indicating possible role of the size effect of the nanoscale deformed volume in controlling the deformation behavior. |
| Proceedings Inclusion? |
Definite: At-meeting proceedings |