| About this Abstract |
| Meeting |
2020 TMS Annual Meeting & Exhibition
|
| Symposium
|
Recent Advances in Functional Materials and 2D/3D Processing for Sensors and Electronic Applications
|
| Presentation Title |
Using In-situ X-ray Scattering to Identify the Mechanical Properties and Piezoelectric Properties of Electrospun P(VDF-TrFE) Nanofibers |
| Author(s) |
Chia-Yin Ma, Tu-Ngoc Lam, Chun-Chieh Wang, Wen-Ching Ko, Wei-Tsung Chuang, Chun-Jen Su, Jyh-Ming Wu, Sz-Nian Lai, Mao-Yuan Lo, Ying-Jhih Wang, E-Wen Huang |
| On-Site Speaker (Planned) |
Chia-Yin Ma |
| Abstract Scope |
In this study, we investigated the effect of annealing on the morphology and crystal phase changes of electrospun poly(vinylidene fluoride trifluoroethylene) (P(VDF-TrFE)) nanofibers. We also identify the underlying deformation mechanisms of as-spun and annealed P(VDF-TrFE) nanofibers during stretch-hold deformation via in-situ synchrotron small and wide angle X-ray scattering (SAXS and WAXS). Annealing process induces an transformation from α to β phase crystalline. The transmission X-ray microscopy (TXM) exhibits the fiber orientations with different strain. In the end, our results demonstrate that annealing is an effective method to improve the piezoelectric response in electrospun P(VDF-TrFE) nanofibers. |
| Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |