About this Abstract |
Meeting |
TMS Specialty Congress 2025
|
Symposium
|
The 7th International Congress on 3D Materials Science (3DMS 2025)
|
Presentation Title |
Dislocation Contrast Simulations in Dark-Field X-Ray Microscopy to Identify Individual Dislocations |
Author(s) |
Sina Borgi, Grethe Winther, Henning Friis Poulsen |
On-Site Speaker (Planned) |
Sina Borgi |
Abstract Scope |
Exploring dislocation identification in bulk deformed crystals using dark-field X-ray microscopy (DFXM) and forward modeling. A covariance matrix of weak beam images shows how variations in dislocation properties (line direction, Burgers vector, and slip plane) affect diffraction contrast, offering insights into DFXM’s sensitivity in distinguishing between different dislocations. In experimental and simulated weak beam images, dislocation distortion fields match closely, confirming DFXM's capability to identify slip planes and Burgers vectors. This is further illustrated by a dislocation undergoing double cross-slip, where the experimental and simulated Burgers vector align, reinforcing DFXM’s accuracy. These advances in simulation and experimental validation establish DFXM as a powerful tool for exploring 3D dislocation dynamics. The method has potential for integration with discrete dislocation dynamics to follow dislocation networks under in situ strain, and using forward modeled images serving as a foundation for supervised machine learning in the DFXM data analysis pipeline. |
Proceedings Inclusion? |
Undecided |