| About this Abstract |
| Meeting |
2025 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
| Presentation Title |
Imaging Defects at the Mesoscale Using a Direct EBSD Detector |
| Author(s) |
McLean P. Echlin, Nicoḷ Maria della Ventura, William C. Lenthe, Kalani Moore, James D Lamb, Fulin Wang, Wyatt A Witzen, Irene J Beyerlein, Tresa M Pollock, Marc De Graef, Dan S Gianola |
| On-Site Speaker (Planned) |
McLean P. Echlin |
| Abstract Scope |
EBSD has dramatically expanded our ability to capture microstructural features and descriptors (twins, grain structure and texture, boundary and phase information) that underpin materials deformation behavior. However, an underutilized wealth of defect information is embedded within the EBSD diffraction patterns. Here we show that the superior sensitivity of silicon-based EBSD detectors versus phosphor coupled detectors, enables the observation of defect structures across many grains in polycrystalline metals, and even in charge-sensitive low symmetry ceramics. Sharpness metrics are calculated from the high quality EBSD patterns and related to total dislocation content in dynamical EBSD pattern simulations. Virtual detectors are applied to the patterns to determine the character of different defect populations. Geometrically necessary dislocations (GNDs) are measured from identical EBSD datasets, providing their distribution within the microstructure. These different measures of dislocation content, which can easily scale to 3D to access mm3-scaled volumes, are important for initialization of deformation models. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Additive Manufacturing, Ceramics |