About this Abstract |
Meeting |
2025 TMS Annual Meeting & Exhibition
|
Symposium
|
Spectroscopic Methods and Analysis for Nuclear Energy Related Materials
|
Presentation Title |
In situ helium implantation and Rutherford backscattering analysis of helium retention in amorphous SiOC |
Author(s) |
Benjamin Ernesto Mejia Diaz, Zhihan Hu, Lin Shao |
On-Site Speaker (Planned) |
Benjamin Ernesto Mejia Diaz |
Abstract Scope |
Amorphous ceramics such as SiOC have been attractive for nuclear applications due to their high melting point, temperature strength, stability, and corrosion resistance. Previous studies show that SiOC is extremely tolerant to irradiation Furthermore, there is no void swelling or cavity formation in helium-implanted SiOC, suggesting that helium is either uniformly diluted or diffuses out of the system. The present study utilized a simultaneous in-situ helium implantation and ion beam analysis technique, by using a dual beam setup at the Accelerator Laboratory of Texas A&M University. The 400 kV accelerator is used to inject helium into SiOC at room temperature, 300°C, and 500°C. After certain helium fluences, 2 MeV proton beam produced from a 1.7 MV accelerator is used to collect Rutherford backscattering spectra of helium in SiOC, as an in-situ characterization method. The study shows that SiOC exhibits ultra-high helium diffusivity, leading to negligible helium retention in the matrix. |
Proceedings Inclusion? |
Planned: |
Keywords |
Nuclear Materials, Ceramics, Other |