About this Abstract |
Meeting |
2025 TMS Annual Meeting & Exhibition
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Symposium
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Advanced Characterization Techniques for Quantifying and Modeling Deformation
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Presentation Title |
In-Situ Deformation Studies with 3D Laue X-Ray Microdiffraction |
Author(s) |
Dina Sheyfer, Doga Gursoy, Michael Prince, Ross Harder, Wonsuk Cha, Kay Song, Ivan Tolkachev, Matthew Diamond, Riccardo Civiero, Michael Wojcik, Wenjun Liu, Yuzi Liu, Tongjun Niu, Aditya Koneru, Karthik Balasubramanian, Anter El-Azab, Subramanian Sankaranarayanan, Felilx Hofmann, Jonathan Tischler |
On-Site Speaker (Planned) |
Dina Sheyfer |
Abstract Scope |
To design new, cost-effective structural materials with enhanced mechanical performance, gaining insight into the evolution of micro/nanoscale features (dislocations, grain boundaries, twins) within the crystalline structure is key. We have developed an instrument for in-situ experiments, along with data analysis capabilities, at the Laue diffraction microscopy station (34-ID-E at the Advanced Photon Source) to enable in-situ deformation studies. As a showcase, nanoindentation was performed twice at the same location on Ni twin grains. The fast acquisition of 3D Laue measurements was made possible with a coded aperture approach to depth resolving. A workflow for 3D reconstruction was established on high-performance computing to obtain 3D strain fields before and after each indentation. Based on these data we have begun to develop novel analysis methods using dislocation dynamics simulations and simulated Laue diffraction. This talk will introduce 3D Laue microscopy and advancements in analysis being developed for users of APS. |
Proceedings Inclusion? |
Planned: |
Keywords |
Characterization, Copper / Nickel / Cobalt, Mechanical Properties |