About this Abstract |
Meeting |
2025 TMS Annual Meeting & Exhibition
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Symposium
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Advanced Characterization Techniques for Quantifying and Modeling Deformation
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Presentation Title |
Combining Dark Field X-ray Microscopy and Computational Approaches to Study Dislocation Dynamics |
Author(s) |
Felix T. Frankus, Adam André William Cretton, Albert Zelenika, Sina Borgi, Anter El-Azab, Henning Friis Poulsen, Grethe Winther |
On-Site Speaker (Planned) |
Felix T. Frankus |
Abstract Scope |
A physically informed understanding of plasticity is essential for accurate models. Discrete Dislocation Dynamics (DDD) provides a framework to study plastic deformation on a microscopic scale. Validating these models with experimental data is challenging. However, Dark-field X-ray Microscopy (DFXM) enables imaging of individual dislocations and their structures deeply embedded in millimetre-sized specimens.
We present the evolution of dislocation structures extracted from DFXM movies of in-situ tensile-deformed millimetre-sized aluminium samples. Our study includes mapping a dislocation volume of 100 µm³ in a single grain of a polycrystalline aluminium sample and observing the rearrangement of the dislocation ensemble through multiple load steps, gradually forming boundaries.
Additionally, we introduce a framework for mapping the strain tensor around the dislocation cores, allowing us to identify dislocation types and line directions. Our findings from the extracted experimental configurations are compared with computational DDD results. |
Proceedings Inclusion? |
Planned: |
Keywords |
Aluminum, Mechanical Properties, Modeling and Simulation |