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About this Abstract
Meeting	2025 TMS Annual Meeting & Exhibition
Symposium	Characterization of Materials through High Resolution Coherent Imaging
Presentation Title	High Bandwidth Scanning X-Ray Microscopy
Author(s)	David Alexander Shapiro
On-Site Speaker (Planned)	David Alexander Shapiro
Abstract Scope	Until recently, the speed of scanning x-ray microscopes has been limited by the brightness of synchrotron x-ray beams, the speed of x-ray detectors and the performance of custom scanning systems. With the realization of high coherent flux from diffraction limited storage rings it has become critical to implement high bandwidth scanning systems and novel imaging schemes to make use of the new x-ray beams. At the Advanced Light Source, we have developed a custom high bandwidth scanning system which can execute scans along arbitrary trajectories that are optimized for the maximum mechanical frequencies of the microscope. These scans minimize overhead and can generate up to 10000 resolution elements per second. We have also implemented a coherent full-field imaging scheme called Randomized Probe Imaging which will reach imaging speeds of 10^6 resolution elements per second with the upgraded source. Combined, these technologies will enable high impact operando microscopy.
Proceedings Inclusion?	Planned:
Keywords	Characterization, Nanotechnology, Computational Materials Science & Engineering

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