| About this Abstract |
| Meeting |
MS&T24: Materials Science & Technology
|
| Symposium
|
Grain Boundaries, Interfaces, and Surfaces: Fundamental Structure-Property-Performance Relationships
|
| Presentation Title |
A Correlative Microscopy Framework for In Situ Grain Growth Studies in Thin Films |
| Author(s) |
Matthew Patrick, Jeffrey Rickman, Katayun Barmak |
| On-Site Speaker (Planned) |
Matthew Patrick |
| Abstract Scope |
Most studies of the dynamics of grain growth and grain boundary (GB) migration are either coarse in time or sample a small portion of the 5-dimensional GB character space. Thin films offer a platform for large-scale, high time-resolution (~1fps) studies of coarsening and boundary migration via in situ scanning/transmission electron microscopy (S/TEM). Here, we capture drift-corrected TEM images of a thin film’s evolving microstructure during annealing using a novel imaging mode. Periodically, the sample is quenched and orientation-mapped using precession-enhanced 4D-STEM. Using a machine learning approach, GBs are detected in the direct images; from these segmentations, the time evolution of the microstructure is quantified. Orientation data are used to reconstruct the 5-dimensional character of each GB and the microstructure’s interfacial behavior is interpreted using dynamic information like GB velocities, obtained from direct imaging. This approach offers one-stop, complete, dynamic characterization of the microstructure’s evolution, not yet possible in other systems. |